Title :
Direct extraction of equivalent circuit parameters for balun on silicon substrate
Author :
Xiong, Yong Zhong ; Teo, T. Hui ; Fu, J.S.
Author_Institution :
Integrated Circuit & Syst. Lab., Inst. of Microelectron., Singapore
Abstract :
A direct extraction technique of equivalent circuit parameters for three-port balun on silicon substrate is developed. The extraction is based on two-port measurement instead of three-port by grounding the third port. This technique greatly simplified the measurement and extraction process. The extracted results are in excellent agreement with the measured results up to 10 GHz.
Keywords :
CMOS integrated circuits; baluns; equivalent circuits; silicon; two-port networks; CMOS; direct extraction technique; equivalent circuit parameters; three-port balun; two-port measurement; Coupling circuits; Electrical resistance measurement; Equivalent circuits; Frequency; Impedance matching; Inductance; Measurement standards; Radiofrequency integrated circuits; Silicon; Solid modeling; Balun; CMOS; direct extraction; equivalent circuit;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2005.851851
