DocumentCode :
1002053
Title :
Special issue on breakdown in advanced gate dielectrics
Volume :
52
Issue :
8
fYear :
2005
Firstpage :
1931
Lastpage :
1931
Abstract :
Provides notice of upcoming special issue(s) of interest to practitioners and researchers.
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2005.854156
Filename :
1468392
Link To Document :
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