DocumentCode
1002208
Title
Design And Test of the 80386
Author
Gelsinger, Patrick P.
Author_Institution
Intel Corp.
Volume
4
Issue
3
fYear
1987
fDate
6/1/1987 12:00:00 AM
Firstpage
42
Lastpage
50
Abstract
A complex design effort, the 80386 was nevertheless one of the company´s most successful projects. The work was completed in less time than scheduled and set an Intel record for tapeout to mask fabricator. The strategy incorporated both top-down and bottom-up design approaches. The top-down flow was external architectural definition, internal architecture, internal unit RTL (register transfer logic) and finally detailed logic. The bottom-up flow was detailed transistor and cell circuit design and layout, block (ALU, PLA, etc.) circuit design and layout, and finally global circuit design and layout. Testability also played an important part in the design´s success. The 80386 combines two forms of designed-in test functions: built-in self-test and test hooks or functions explicitly designed in to aid testing.
Keywords
Automatic testing; Circuit synthesis; Circuit testing; Microprocessors; Pipeline processing; Production; Programmable logic arrays; Protection; Read only memory; Registers;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1987.295165
Filename
4069991
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