• DocumentCode
    1002208
  • Title

    Design And Test of the 80386

  • Author

    Gelsinger, Patrick P.

  • Author_Institution
    Intel Corp.
  • Volume
    4
  • Issue
    3
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    42
  • Lastpage
    50
  • Abstract
    A complex design effort, the 80386 was nevertheless one of the company´s most successful projects. The work was completed in less time than scheduled and set an Intel record for tapeout to mask fabricator. The strategy incorporated both top-down and bottom-up design approaches. The top-down flow was external architectural definition, internal architecture, internal unit RTL (register transfer logic) and finally detailed logic. The bottom-up flow was detailed transistor and cell circuit design and layout, block (ALU, PLA, etc.) circuit design and layout, and finally global circuit design and layout. Testability also played an important part in the design´s success. The 80386 combines two forms of designed-in test functions: built-in self-test and test hooks or functions explicitly designed in to aid testing.
  • Keywords
    Automatic testing; Circuit synthesis; Circuit testing; Microprocessors; Pipeline processing; Production; Programmable logic arrays; Protection; Read only memory; Registers;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1987.295165
  • Filename
    4069991