DocumentCode
1002596
Title
Applications of interferometric measurements of surface topography of moving magnetic recording materials
Author
Robinson, Geln M. ; Moran, Patrick J. ; Peterson, Richard W. ; Englund, Craig D.
Author_Institution
3M Company, 3M Center, Saint Paul, Minnesota, USA.
Volume
20
Issue
5
fYear
1984
fDate
9/1/1984 12:00:00 AM
Firstpage
915
Lastpage
917
Abstract
A laser scanning interferometer is used to measure surface profiles and quality parameters of moving loops of magnetic tape and rotating diskettes. A spatial resolution of one micrometer and a vertical resolution of one nanometer are obtained. Reproducibility of RMS measurements of asperity height is also within one nanometer.
Keywords
Laser applications, measurement; Magnetic disk recording; Magnetic tape recording; Optical interferometry; Magnetic materials; Magnetic recording; Optical materials; Reproducibility of results; Rotation measurement; Spatial resolution; Surface emitting lasers; Surface topography;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1984.1063151
Filename
1063151
Link To Document