Title :
Applications of interferometric measurements of surface topography of moving magnetic recording materials
Author :
Robinson, Geln M. ; Moran, Patrick J. ; Peterson, Richard W. ; Englund, Craig D.
Author_Institution :
3M Company, 3M Center, Saint Paul, Minnesota, USA.
fDate :
9/1/1984 12:00:00 AM
Abstract :
A laser scanning interferometer is used to measure surface profiles and quality parameters of moving loops of magnetic tape and rotating diskettes. A spatial resolution of one micrometer and a vertical resolution of one nanometer are obtained. Reproducibility of RMS measurements of asperity height is also within one nanometer.
Keywords :
Laser applications, measurement; Magnetic disk recording; Magnetic tape recording; Optical interferometry; Magnetic materials; Magnetic recording; Optical materials; Reproducibility of results; Rotation measurement; Spatial resolution; Surface emitting lasers; Surface topography;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1984.1063151
