DocumentCode
1002602
Title
Technology Constraints, Present and Future
Author
Verhofstadt, Peter W J
Author_Institution
Fairchild Camera and Instrument Corporation
Volume
9
Issue
1
fYear
1976
Firstpage
32
Lastpage
35
Abstract
The technology session of the Asilomar Workshop was oriented mainly towards the constraints of future technologies rather than towards discussing present generally-accepted processes. Four specific areas were highlighted: testing of micro-processors, the future of silicon-on-sapphire (SOS) approaches, the impact of integrated injection logic (I2L), and the role of less-high-density technologies (TTL, ECL, CMOS) in microprocessor development.
Keywords
CMOS integrated circuits; Leakage current; Microprocessors; Sapphire; Silicon; Substrates;
fLanguage
English
Journal_Title
Computer
Publisher
ieee
ISSN
0018-9162
Type
jour
DOI
10.1109/C-M.1976.218383
Filename
1647158
Link To Document