• DocumentCode
    1002602
  • Title

    Technology Constraints, Present and Future

  • Author

    Verhofstadt, Peter W J

  • Author_Institution
    Fairchild Camera and Instrument Corporation
  • Volume
    9
  • Issue
    1
  • fYear
    1976
  • Firstpage
    32
  • Lastpage
    35
  • Abstract
    The technology session of the Asilomar Workshop was oriented mainly towards the constraints of future technologies rather than towards discussing present generally-accepted processes. Four specific areas were highlighted: testing of micro-processors, the future of silicon-on-sapphire (SOS) approaches, the impact of integrated injection logic (I2L), and the role of less-high-density technologies (TTL, ECL, CMOS) in microprocessor development.
  • Keywords
    CMOS integrated circuits; Leakage current; Microprocessors; Sapphire; Silicon; Substrates;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/C-M.1976.218383
  • Filename
    1647158