DocumentCode :
1002602
Title :
Technology Constraints, Present and Future
Author :
Verhofstadt, Peter W J
Author_Institution :
Fairchild Camera and Instrument Corporation
Volume :
9
Issue :
1
fYear :
1976
Firstpage :
32
Lastpage :
35
Abstract :
The technology session of the Asilomar Workshop was oriented mainly towards the constraints of future technologies rather than towards discussing present generally-accepted processes. Four specific areas were highlighted: testing of micro-processors, the future of silicon-on-sapphire (SOS) approaches, the impact of integrated injection logic (I2L), and the role of less-high-density technologies (TTL, ECL, CMOS) in microprocessor development.
Keywords :
CMOS integrated circuits; Leakage current; Microprocessors; Sapphire; Silicon; Substrates;
fLanguage :
English
Journal_Title :
Computer
Publisher :
ieee
ISSN :
0018-9162
Type :
jour
DOI :
10.1109/C-M.1976.218383
Filename :
1647158
Link To Document :
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