• DocumentCode
    1002663
  • Title

    An Over-60 dB True Rail-to-Rail Performance Using Correlated Level Shifting and an Opamp With Only 30 dB Loop Gain

  • Author

    Gregoire, B. Robert ; Moon, Un-Ku

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR
  • Volume
    43
  • Issue
    12
  • fYear
    2008
  • Firstpage
    2620
  • Lastpage
    2630
  • Abstract
    Correlated level shifting (CLS) is introduced as a new switched-capacitor technique to provide true rail-to-rail performance while reducing errors from finite opamp gain. There is negligible kT/C noise increase and in many cases a speed advantage compared to using a high gain opamp. The gain enhancement is quantified with formulas and the general technique is compared to correlated double sampling (CDS). Results are presented from a 0.18 mum CMOS testchip of a 20 MHz, 12-bit pipelined A/D converter using CLS to reduce errors from finite opamp dc gain and limited opamp swing. It achieves 10.5 ENOB operating beyond the supply rails using an opamp circuit with 30 dB loop gain and 0.9 V supply.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; operational amplifiers; switched capacitor networks; CMOS; correlated level shifting; frequency 20 MHz; gain enhancement; opamp; pipelined A/D converter; size 0.18 mum; switched-capacitor technique; true rail-rail performance; voltage 0.9 V; Analog circuits; Analog-digital conversion; Circuit testing; Computer errors; Computer science; Moon; Performance gain; Rail to rail amplifiers; Sampling methods; Voltage; Correlated double sampling (CDS); correlated level shifting (CLS); pipelined analog-to-digital converter; rail-to-rail;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2008.2006312
  • Filename
    4684624