DocumentCode
1002663
Title
An Over-60 dB True Rail-to-Rail Performance Using Correlated Level Shifting and an Opamp With Only 30 dB Loop Gain
Author
Gregoire, B. Robert ; Moon, Un-Ku
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR
Volume
43
Issue
12
fYear
2008
Firstpage
2620
Lastpage
2630
Abstract
Correlated level shifting (CLS) is introduced as a new switched-capacitor technique to provide true rail-to-rail performance while reducing errors from finite opamp gain. There is negligible kT/C noise increase and in many cases a speed advantage compared to using a high gain opamp. The gain enhancement is quantified with formulas and the general technique is compared to correlated double sampling (CDS). Results are presented from a 0.18 mum CMOS testchip of a 20 MHz, 12-bit pipelined A/D converter using CLS to reduce errors from finite opamp dc gain and limited opamp swing. It achieves 10.5 ENOB operating beyond the supply rails using an opamp circuit with 30 dB loop gain and 0.9 V supply.
Keywords
CMOS integrated circuits; analogue-digital conversion; operational amplifiers; switched capacitor networks; CMOS; correlated level shifting; frequency 20 MHz; gain enhancement; opamp; pipelined A/D converter; size 0.18 mum; switched-capacitor technique; true rail-rail performance; voltage 0.9 V; Analog circuits; Analog-digital conversion; Circuit testing; Computer errors; Computer science; Moon; Performance gain; Rail to rail amplifiers; Sampling methods; Voltage; Correlated double sampling (CDS); correlated level shifting (CLS); pipelined analog-to-digital converter; rail-to-rail;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2008.2006312
Filename
4684624
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