Title :
Microwave properties of free-standing dielectric films
Author :
Robertson, W.M. ; Arjavalingam, G. ; Hougham, G. ; Kopcsay, Gerard V. ; Edelstein, D. ; Chapple-Sokol, J.D.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
Measurement of the broadband (15-150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on ( approximately 200 mu m thick) polymer films are presented.
Keywords :
dielectric thin films; microwave measurement; microwave spectroscopy; polymer films; silicon compounds; 15 to 150 GHz; coherent microwave transient spectroscopy; free-standing dielectric films; fused silica sheet; microwave dielectric properties; polymer films;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19920039
