DocumentCode :
1002856
Title :
Current gain of silicon bipolar transistor with polysilicon emitter contact
Author :
Mehta, S.K.
Author_Institution :
Solid State Physics Laboratory, Delhi, India
Volume :
20
Issue :
7
fYear :
1984
Firstpage :
294
Lastpage :
295
Abstract :
A two-region analysis is presented to predict the common-emitter current gain of a bipolar transistor with the polysilicon contact to the emitter for a case when the recombinations at the mono-poly interface are not negligible. The calculated current-gain enhancement for typical device parameters and for different values of interface recombination velocity show that the current-gain enhancement and its increase with decrease of emitter width is smaller for the interface with larger recombinations.
Keywords :
bipolar transistors; elemental semiconductors; silicon; Si bipolar transistor; carrier recombinations; common-emitter current gain; current gain; elemental semiconductor; mono-poly interface; polySi emitter contact; two-region analysis;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19840201
Filename :
4250489
Link To Document :
بازگشت