• DocumentCode
    1003017
  • Title

    Testing And Applications of Inverter-Free PLAs

  • Author

    Rajski, Janusz ; Agarwal, Vinod K.

  • Author_Institution
    McGill University
  • Volume
    4
  • Issue
    6
  • fYear
    1987
  • Firstpage
    30
  • Lastpage
    40
  • Abstract
    The testing properties of inverter-free PLAs make them ideal for application to totally self-checking and easily testable circuits. After a class of test patterns and masking relations for these new patterns are determined, a complete test set for single and multiple crosspoint faults can be easily generated. Moreover, the procedure does not require any fault simulation. The code space inputs detect all single and multiple faults in PLAs for totally self-checking circuits, even if the faults are not unidirectional. The test results can be used to analyze easily testable PLAs. With minor hardware changes in one-input decoder PLAs, the personality matrix will serve as a complete test set.
  • Keywords
    Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Decoding; Electrical fault detection; Fault detection; Hardware; Programmable logic arrays; Test pattern generators;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1987.295215
  • Filename
    4070069