• DocumentCode
    1003481
  • Title

    Definition of residual error model for network analyser measurements

  • Author

    Pasquet, Daniel ; Abdellaoui, Mahmoud ; Gautier, Jean-Luc ; Verdier, A.

  • Author_Institution
    ENSEA, Cergy Pontoise, France
  • Volume
    28
  • Issue
    15
  • fYear
    1992
  • fDate
    7/16/1992 12:00:00 AM
  • Firstpage
    1426
  • Lastpage
    1428
  • Abstract
    The measurement of S parameters with a network analyser is affected by both systematic and random errors. Several error models exist for systematic errors. A similar model is proposed to evaluate the random errors which affect the measured values of S parameters when systematic errors have been extracted. This error model is independent of the measured DUT and characterises only the sensitivity of a given calibration procedure to random error. A simulation on a TRL calibration is shown as an example.
  • Keywords
    S-parameters; calibration; measurement errors; microwave measurement; network analysers; TRL calibration; calibration procedure; error models; network analyser measurements; random errors; residual error model; sensitivity; simulation; systematic errors; thru-reflect-line calibration;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19920907
  • Filename
    256054