DocumentCode
1003481
Title
Definition of residual error model for network analyser measurements
Author
Pasquet, Daniel ; Abdellaoui, Mahmoud ; Gautier, Jean-Luc ; Verdier, A.
Author_Institution
ENSEA, Cergy Pontoise, France
Volume
28
Issue
15
fYear
1992
fDate
7/16/1992 12:00:00 AM
Firstpage
1426
Lastpage
1428
Abstract
The measurement of S parameters with a network analyser is affected by both systematic and random errors. Several error models exist for systematic errors. A similar model is proposed to evaluate the random errors which affect the measured values of S parameters when systematic errors have been extracted. This error model is independent of the measured DUT and characterises only the sensitivity of a given calibration procedure to random error. A simulation on a TRL calibration is shown as an example.
Keywords
S-parameters; calibration; measurement errors; microwave measurement; network analysers; TRL calibration; calibration procedure; error models; network analyser measurements; random errors; residual error model; sensitivity; simulation; systematic errors; thru-reflect-line calibration;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19920907
Filename
256054
Link To Document