• DocumentCode
    1003653
  • Title

    Selftesting CMOS operational amplifier

  • Author

    Roca, M. ; Rubio, Albert

  • Author_Institution
    Dept. of Phys., Univ. Illes Balears, Palma de Mallorca, Spain
  • Volume
    28
  • Issue
    15
  • fYear
    1992
  • fDate
    7/16/1992 12:00:00 AM
  • Firstpage
    1452
  • Lastpage
    1454
  • Abstract
    The testability of failures modelled by bridges and stuck-open faults in CMOS current mode based operational amplifiers is investigated. The functional and IDD current effects caused by these types of failure in the circuits are presented. A current sensing circuit oriented to BIST, based on current mirrors is also developed. From these results, a selftesting operational amplifier circuit is proposed.
  • Keywords
    CMOS integrated circuits; built-in self test; failure analysis; integrated circuit testing; linear integrated circuits; operational amplifiers; BIST; CMOS operational amplifier; bridges; current mirrors; current mode; current sensing circuit; failures; self test opamp; selftesting op amp; stuck-open faults; testability;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19920924
  • Filename
    256069
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1003653