• DocumentCode
    1004034
  • Title

    4Mb on-chip-cache bubble memory chips with 4 µm period ion-implanted propagation patterns

  • Author

    Urai, H. ; Mizuno, K. ; Asada, S. ; Takada, N. ; Yoshioka, N. ; Gokan, H. ; Yoshimi, K.

  • Author_Institution
    NEC Corporation, Kawasaki, Japan
  • Volume
    20
  • Issue
    5
  • fYear
    1984
  • fDate
    9/1/1984 12:00:00 AM
  • Firstpage
    1072
  • Lastpage
    1074
  • Abstract
    4Mb ion-implanted bubble devices (IIBD) with on-chip-cache organization (OCCO) have been designed for 1μm bubbles, and characterized for all functional elements in the devices. The 4Mb memory chip with 9.5×11.8 mm chip size consists of the same two 2Mb units, each of which is divided into 1Mb even and odd sites with 300 strorage loops (s-loops) and cache loops (c-loops), whose bit lengths are 4160 bits and 130 bits, repectively. Basic bit cell size is 4 × 4 μm. The 4Mb chip has an OCCO structure with the following distinguishing functional elements: (1) Bidirectional N-shape transfer gates. (2) A major line replicator with 2 crossed hairpin conductors. (3) DRO detector with folded thin NiFe elements. (4) A hairpin nucleation generator in a 240° super track. (5) Even bit minor loops. Operating margins for the 4Mb IIBD fabricated on (YSmLuBiCa)3(FeGe)5O12are well balanced in all functional elements, and obtained as 25 Oe, sufficient for practical use. It has been found that in-plane holding field applied to stop/start (s/s) direction is necessary for s/s stabilization, and that anisotropy along pattern edges due to stress relief acts a significant role for bit instability and for c-s gate operation. LPE film thickness has been optimized as 1.1 μm for 100-120 keV He+ implantation.
  • Keywords
    Cache memories; Magnetic bubble device fabrication; Magnetic bubble memories; Anisotropic magnetoresistance; Chip scale packaging; Conductors; Detectors; Fabrication; Large scale integration; Memory architecture; Shape; Stress; Tracking loops;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1984.1063284
  • Filename
    1063284