DocumentCode :
1004096
Title :
Modeling of switched-capacitor delta-sigma Modulators in SIMULINK
Author :
Zare-Hoseini, Hashem ; Kale, Izzet ; Shoaei, Omid
Author_Institution :
Appl. DSP & VLSI Res. Group, Univ. of Westminster, London, UK
Volume :
54
Issue :
4
fYear :
2005
Firstpage :
1646
Lastpage :
1654
Abstract :
Precise behavioral modeling of switched-capacitor ΔΣ modulators is presented. Considering noise (switches´ and op-amps´ thermal noise), clock jitter, nonidealities of integrators and op-amps including finite dc-gain (DCG) and unity gain bandwidth, slew-limiting, DCG nonlinearities and the input parasitic capacitance, quantizer hysteresis, switches´ clock-feedthrough, and charge injection, exhaustive behavioral simulations that are close models of the transistor-level ones can be performed. The DCG nonlinearity of the integrators, which is not considered in many ΔΣ modulators´ modeling attempts, is analyzed, estimated, and modeled. It is shown that neglecting this parameter would lead to a significant underestimation of the modulators´ behavior and increase the noise floor as well as the harmonic distortion at the output of the modulator. Evaluation and validation of the models were done via behavioral and transistor-level simulations for a second-order modulator using SIMULINK and HSPICE with a generic 0.35-μm CMOS technology. The effects of the nonidealities and nonlinearities are clearly seen when compared to the ideal modulator in the behavioral and actual modulator in the circuit-level environment.
Keywords :
CMOS digital integrated circuits; circuit simulation; delta-sigma modulation; integrated circuit modelling; integrated circuit noise; jitter; switched capacitor networks; 0.35 micron; CMOS digital integrated circuits; DCG integrator nonlinearity; SIMULINK; behavioral modeling; behavioral simulation; circuit simulation; clock jitter; integrated circuit modeling; integrated circuit noise; switched-capacitor ΔΣ modulators; switched-capacitor delta-sigma modulators; transistor-level simulation; Bandwidth; CMOS technology; Clocks; Delta modulation; Hysteresis; Jitter; Operational amplifiers; Parasitic capacitance; Performance gain; Switches; Charge injection; SIMULINK; clock feedthrough; correlated double sampling; delta–sigma modulators; hysteresis; nonideality; nonlinearity; switched capacitor;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2005.851085
Filename :
1468583
Link To Document :
بازگشت