• DocumentCode
    1004124
  • Title

    Monitoring the final on-zone dynamics in TIL GTO thyristors

  • Author

    Silard, A.P.

  • Author_Institution
    Polytechnic Institute, Department of Electronics, Bucharest, Romania
  • Volume
    21
  • Issue
    16
  • fYear
    1985
  • Firstpage
    691
  • Lastpage
    693
  • Abstract
    An original method that spotlights the increase of the final on-zone of the squeezed plasma with the level of anode current is described and implemented in the gated turn-off experimental investigation of TO-220-packaged, high-voltage TIL GTO thyristors.
  • Keywords
    semiconductor device models; thyristors; TIL GTO thyristors; TO-220-packaged; final on-zone dynamics; high-voltage TIL GTO thyristors; squeezed plasma; two interdigitation level;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19850489
  • Filename
    4250696