DocumentCode
10043
Title
Design and Performances of 4H-SiC Bipolar Mode Field Effect Transistor (BMFETs)
Author
Bellone, Salvatore ; Di Benedetto, Luigi
Author_Institution
Univ. degli Studi di Salerno, Fisciano, Italy
Volume
29
Issue
5
fYear
2014
fDate
May-14
Firstpage
2174
Lastpage
2179
Abstract
An original design of 4H polytype of silicon carbide (4H-SiC) bipolar-mode field-effect transistors (BMFETs), which combines the on-state operation of silicon version with the off-state behavior of SiC-VJFETs (vertical junction field-effect transistor), is analyzed by numerical simulations. Using the physical parameters extracted from the previous experimental analysis, this paper shows the feasibility of 4H-SiC BMFETs to manage drain current densities as high as 500 A/cm 2 with a current gain of 50 and to sustain blocking voltage of 2.1 kV. Comparisons with the existing 4H-SiC power transistors, like bipolar junction transistors (BJTs), VJFETs, and double-diffusive metal-oxide-semiconductor FETs, show that, besides a thermal stability in the examined range 300-523 K, BMFET exhibits the low on-resistance of BJTs and can operate at the high frequencies of power FETs.
Keywords
bipolar transistors; field effect transistors; power semiconductor devices; silicon compounds; thermal stability; wide band gap semiconductors; BMFET; SiC; VJFET off-state behavior; bipolar mode field effect transistor; on-state operation; temperature 300 K to 523 K; thermal stability; vertical junction field effect transistor; voltage 2.1 kV; Conductivity; Junctions; Logic gates; Silicon; Silicon carbide; Switches; Thermal stability; 4H polytype of silicon carbide (4H-SiC); Bipolar-mode field-effect transistors (BMFET); power FETs; power bipolar transistors;
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/TPEL.2013.2281781
Filename
6600862
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