• DocumentCode
    1004642
  • Title

    Direct electro-optic sampling of GaAs integrated circuits

  • Author

    Weingarten, Kurt J. ; Rodwell, Mark J. W. ; Heinrich, H.K. ; Kolner, B.H. ; Bloom, D.M.

  • Author_Institution
    Stanford University, Edward L. Ginzton Laboratory, Stanford, USA
  • Volume
    21
  • Issue
    17
  • fYear
    1985
  • Firstpage
    765
  • Lastpage
    766
  • Abstract
    We report the first electro-optic sampling measurements made directly within an integrated circuit. Using the electro-optic effect in GaAs, we have noninvasively probed the internal voltage waveforms of a 2¿12 GHz GaAs FET travelling-wave amplifier integrated circuit driven by a microwave signal source.
  • Keywords
    III-V semiconductors; electro-optical effects; gallium arsenide; integrated circuit testing; measurement by laser beam; microwave integrated circuits; 2 GHz to 12 GHz; FET travelling-wave amplifier; GaAs integrated circuits; IC testing; MMIC; Nd:YAG laser; SHF; electro-optic sampling; internal voltage waveforms; microwave signal source; monolithic microwave IC; noninvasive probe measurement;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19850539
  • Filename
    4250755
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1004642