• DocumentCode
    1004686
  • Title

    Extended temperature operation of one megabit bubble memory devices

  • Author

    Arbaugh, L.G., Jr. ; Markham, D.C.

  • Author_Institution
    Motorola Inc., Tempe, AZ, U.S.A.
  • Volume
    20
  • Issue
    5
  • fYear
    1984
  • fDate
    9/1/1984 12:00:00 AM
  • Firstpage
    1060
  • Lastpage
    1065
  • Abstract
    We have demonstrated that the operating temperature range of MBM2011A commercial (0-70°C) one megabit bubble memory devices may be significantly extended by application of temperature compensation to the chip biasing field and function currents. Compensation of biasing field is achieved using the internal z-bias coil of the device. Full functionality and non-volatility of devices over a -55°C to +85°C case temperature range have been achieved using predominantly linear tracking rules. This greatly increased operating temperature range significantly extends the application range of bubble technology.
  • Keywords
    Magnetic bubble memories; Magnetic thermal factors; Circuit synthesis; Circuit testing; Coils; Conducting materials; Impedance; Magnets; Packaging; Production; Temperature dependence; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1984.1063341
  • Filename
    1063341