Title :
Extended temperature operation of one megabit bubble memory devices
Author :
Arbaugh, L.G., Jr. ; Markham, D.C.
Author_Institution :
Motorola Inc., Tempe, AZ, U.S.A.
fDate :
9/1/1984 12:00:00 AM
Abstract :
We have demonstrated that the operating temperature range of MBM2011A commercial (0-70°C) one megabit bubble memory devices may be significantly extended by application of temperature compensation to the chip biasing field and function currents. Compensation of biasing field is achieved using the internal z-bias coil of the device. Full functionality and non-volatility of devices over a -55°C to +85°C case temperature range have been achieved using predominantly linear tracking rules. This greatly increased operating temperature range significantly extends the application range of bubble technology.
Keywords :
Magnetic bubble memories; Magnetic thermal factors; Circuit synthesis; Circuit testing; Coils; Conducting materials; Impedance; Magnets; Packaging; Production; Temperature dependence; Temperature distribution;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1984.1063341