DocumentCode
1004686
Title
Extended temperature operation of one megabit bubble memory devices
Author
Arbaugh, L.G., Jr. ; Markham, D.C.
Author_Institution
Motorola Inc., Tempe, AZ, U.S.A.
Volume
20
Issue
5
fYear
1984
fDate
9/1/1984 12:00:00 AM
Firstpage
1060
Lastpage
1065
Abstract
We have demonstrated that the operating temperature range of MBM2011A commercial (0-70°C) one megabit bubble memory devices may be significantly extended by application of temperature compensation to the chip biasing field and function currents. Compensation of biasing field is achieved using the internal z-bias coil of the device. Full functionality and non-volatility of devices over a -55°C to +85°C case temperature range have been achieved using predominantly linear tracking rules. This greatly increased operating temperature range significantly extends the application range of bubble technology.
Keywords
Magnetic bubble memories; Magnetic thermal factors; Circuit synthesis; Circuit testing; Coils; Conducting materials; Impedance; Magnets; Packaging; Production; Temperature dependence; Temperature distribution;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1984.1063341
Filename
1063341
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