DocumentCode :
1004829
Title :
Measurements of magnetic characteristics of thin film heads using magneto-optical method
Author :
Narishige, S. ; Hanazono, M. ; Takagi, M. ; Kuwatsuka, S.
Author_Institution :
Hitachi Research Lab., Hitachi City, Ibaraki, Japan
Volume :
20
Issue :
5
fYear :
1984
fDate :
9/1/1984 12:00:00 AM
Firstpage :
848
Lastpage :
850
Abstract :
Using a micro-Kerr magneto-optic apparatus, magnetization curves of thin film heads were measured. Relationships between repeatability of the magnetization process and readback wave form distortion were examined. In yokes made of positive magnetostriction NiFe the trianglar edge domains were found to be large, the magnetization process was not repeatable and readback wave form distortion was observed. For negative magnetostrictive yokes, the edge domains were smaller, the magnetization process was repeatable and wave form distortion was not observed.
Keywords :
Magnetic recording/reading heads; Magnetooptic measurements; Distortion measurement; Magnetic domains; Magnetic films; Magnetic heads; Magnetic levitation; Magnetization processes; Magnetooptic effects; Magnetostriction; Sputtering; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1984.1063355
Filename :
1063355
Link To Document :
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