DocumentCode :
1005166
Title :
Fundamental high-frequency performance limit for impatt mode operation
Author :
Blakey, P.A. ; Froelich, R.K.
Author_Institution :
University of Michigan, Electron Physics Laboratory Department of Electrical & Computer Engineering, Ann Arbor, USA
Volume :
21
Issue :
1
fYear :
1985
Firstpage :
28
Lastpage :
29
Abstract :
It is well known that the phase delay associated with carrier energy relaxation in impatt diodes tends to improve their performance. The purpose of the letter is to point out that there is also an amplitude degradation effect which tends to impair impatt performance. At high enough frequencies the amplitude degradation effect dominates, leading to a high-frequency performance roll-off. The net effect of energy relaxation is believed to be deleterious for frequencies above about 500 GHz for Si devices, and at lower frequencies for GaAs devices.
Keywords :
IMPATT diodes; high-frequency effects; 500 GHz; GaAs devices; IMPATT mode operation; Si devices; amplitude degradation effect; carrier energy relaxation; high-frequency performance limit; phase delay;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19850022
Filename :
4250826
Link To Document :
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