• DocumentCode
    1005166
  • Title

    Fundamental high-frequency performance limit for impatt mode operation

  • Author

    Blakey, P.A. ; Froelich, R.K.

  • Author_Institution
    University of Michigan, Electron Physics Laboratory Department of Electrical & Computer Engineering, Ann Arbor, USA
  • Volume
    21
  • Issue
    1
  • fYear
    1985
  • Firstpage
    28
  • Lastpage
    29
  • Abstract
    It is well known that the phase delay associated with carrier energy relaxation in impatt diodes tends to improve their performance. The purpose of the letter is to point out that there is also an amplitude degradation effect which tends to impair impatt performance. At high enough frequencies the amplitude degradation effect dominates, leading to a high-frequency performance roll-off. The net effect of energy relaxation is believed to be deleterious for frequencies above about 500 GHz for Si devices, and at lower frequencies for GaAs devices.
  • Keywords
    IMPATT diodes; high-frequency effects; 500 GHz; GaAs devices; IMPATT mode operation; Si devices; amplitude degradation effect; carrier energy relaxation; high-frequency performance limit; phase delay;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19850022
  • Filename
    4250826