DocumentCode :
1005194
Title :
Temperature dependence of epoxy resistance to PD
Author :
Schifani, Rosario
Author_Institution :
Dipartimento di Ingegneria Elettrica, Palermo Univ., Italy
Volume :
2
Issue :
4
fYear :
1995
fDate :
8/1/1995 12:00:00 AM
Firstpage :
653
Lastpage :
659
Abstract :
In this paper are presented the results of a research program on comparative test procedures on epoxy materials, in the presence of internal partial discharges under varied thermal working conditions. These studies involved only two materials. New data on other materials, filled and unfilled, are presented and analyzed. The time to breakdown of specimens subjected to 25 kV sinusoidal voltage under different testing temperatures is examined. A modified version of the CIGRE test cell, Method I, is used to obtain specimens with an hemispherical internal cavity geometry between embedded electrodes. This arrangement permits very high signal to noise ratio values and thereby fully exploits the recent digital techniques based on pulse amplitude analysis and off-line treatment of recorded data. Finally, different discharge mechanisms, governing the aging activity of cavities at 20 and 80°C respectively, were observed
Keywords :
ageing; electric breakdown; epoxy insulation; filled polymers; insulation testing; partial discharges; 20 C; 25 kV; 80 C; CIGRE test cell; aging; digital techniques; epoxy materials; filled materials; hemispherical internal cavity; internal partial discharges; off-line data treatment; pulse amplitude analysis; signal to noise ratio; temperature dependence; thermal working conditions; time to breakdown; unfilled materials; Breakdown voltage; Electrodes; Employee welfare; Geometry; Materials testing; Partial discharges; Signal analysis; Signal to noise ratio; Temperature dependence; Thermal resistance;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/94.407029
Filename :
407029
Link To Document :
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