• DocumentCode
    1005523
  • Title

    Influence of aging on classification of PD in HV components

  • Author

    Gulski, Edward ; Kridva, A.

  • Author_Institution
    High Voltage Lab., Delft Univ. of Technol., Netherlands
  • Volume
    2
  • Issue
    4
  • fYear
    1995
  • fDate
    8/1/1995 12:00:00 AM
  • Firstpage
    676
  • Lastpage
    684
  • Abstract
    In this presentation the influence of degradation of discharging dielectric on phase-resolved patterns of partial discharges (PD) is studied. Using conventional PD detection and statistical analysis, internal discharges in a flat cavity, and in epoxy insulation of two HV components were analyzed during long term tests. The results indicate that aging progress was accompanied by few consecutive changes in the phase-resolved patterns. This observation might become important for two applications: the developing of databases of different discharging defects, and the analysis of discharge degradation of dielectrics
  • Keywords
    ageing; epoxy insulation; partial discharges; HV components; PD detection; aging; databases; defects; dielectric degradation; epoxy insulation; flat cavity; internal discharges; partial discharges; phase-resolved patterns; statistical analysis; Aging; Degradation; Dielectrics; Electric breakdown; Fault location; Fingerprint recognition; Partial discharges; Polyethylene; Statistical analysis; Testing;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.407032
  • Filename
    407032