Microwave effective linewidth in amorphous Co-Ta films

The effective linewidth method, originally developed to study microwave losses and micro-structure in ferrites, has been applied to amorphous Co-Ta metallic films for the first time. The effective linewidth spectra reveal the presence of two magnon scattering relaxation processes in these films and are very sensitive to microsctructure changes. The effective linewidth technique can therefore be used to study structural relaxation and recrystallization processes in amorphous alloys.