DocumentCode
1005901
Title
Standard instrument configuration for parametric testing
Author
Walton, A.J. ; Robertson, J.M. ; Holwill, R. ; Moore, M.B.
Author_Institution
University of Edinburgh, Edinburgh Microfabrication Facility, Department of Electrical Engineering, Edinburgh, UK
Volume
21
Issue
4
fYear
1985
Firstpage
127
Lastpage
128
Abstract
A standard configuration for parametric test structures is proposed which can then be measured using instrumentation which is hardwired to the probes. The appropriate connections are made on-chip, which significantly reduces the complexity and expense of the measurement system.
Keywords
automatic testing; integrated circuit testing; IC testing; hardwiring; instrument configuration; onchip testing; parametric testing; process control chips;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19850090
Filename
4250901
Link To Document