• DocumentCode
    1005928
  • Title

    Testing and Evaluation of Insulating Films Part II: Test Results Using Facilities at the University at Buffalo

  • Author

    Laghari, J.R. ; Kumar, K. ; Hammoud, A. ; Bilodeau, T. ; Treanor, M. ; Cygan, S. ; Shea, J. ; Kraus, R. ; Fitzpatrick, G.

  • Author_Institution
    State University of New York
  • Volume
    2
  • Issue
    6
  • fYear
    1986
  • Firstpage
    22
  • Lastpage
    26
  • Abstract
    In this second part of a two-part article, representative data using the insulation test facilities at the University at Buffalo is presented. It is also shown how this data is useful toward the design of reliable high voltage systems.
  • Keywords
    Annealing; Crystallization; Dielectric measurements; Insulation testing; Morphology; Optical films; Temperature; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0883-7554
  • Type

    jour

  • DOI
    10.1109/MEI.1986.290503
  • Filename
    4070357
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1005928