DocumentCode
1006361
Title
Dynamic impact of self-heating on input impedance of bipolar transistors
Author
de Souza, A.A.L. ; Nallatamby, J.C. ; Prigent, M. ; Quéré, R.
Author_Institution
XLIM-Dep. Univ. of Limoges, Brive, France
Volume
42
Issue
13
fYear
2006
fDate
6/22/2006 12:00:00 AM
Firstpage
777
Lastpage
778
Abstract
The influence of self-heating on the input impedance of bipolar transistors is analytically derived and experimental data presented to validate the analysis. The effect is mainly governed by the collector biasing conditions, and may be advantageously explored up to the thermal response cutoff frequency of the device.
Keywords
bipolar transistors; semiconductor device models; bipolar transistor input impedance; collector biasing conditions; dynamic self-heating impact; forward transconductance; input impedance; output conductance; thermal response cutoff frequency;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20060904
Filename
1648584
Link To Document