DocumentCode
1006548
Title
Magnetic and crystalline properties of ion-implanted garnet films with plasma exposure
Author
Betsui, K. ; Miyashita, T. ; Komenou, K.
Author_Institution
Fujitsu Laboratories, Atsugi, Japan
Volume
20
Issue
5
fYear
1984
fDate
9/1/1984 12:00:00 AM
Firstpage
1117
Lastpage
1119
Abstract
The implantation induced anisotropy field change, ΔHk, and lattice strain, Δd/d, in ion implanted films have been found to be enhanced considerably by exposing films to plasma of H2 , He, Ne and Ar gases in the substrate temperature greater than 100°C. The enhanced ΔHk is twice as large as the as-implanted value in typical experiments, and it is comparable to the ΔHk of the hydrogen ion implanted layer. The enhanced ΔHk of the exposed film decreases greatly with increasing annealing temperature, but this can be prevented coating the surface with an SiO2 layer. The changes of ΔHk profiles in plasma exposure are obtained by FMR technique. ΔHk is enhanced not only at the surface but also deep in the implanted layer. The origin of this effect is probably ascribed to the diffusion of the residual hydrogen into the implanted layer.
Keywords
Magnetic bubble device fabrication; Plasma applications, materials processing; Anisotropic magnetoresistance; Crystallization; Garnet films; Hydrogen; Magnetic anisotropy; Magnetic films; Magnetic properties; Perpendicular magnetic anisotropy; Plasma properties; Plasma temperature;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1984.1063507
Filename
1063507
Link To Document