DocumentCode :
1006900
Title :
A lumped scalable model for silicon integrated spiral inductors
Author :
Scuderi, Angelo ; Biondi, Tonio ; Ragonese, Egidio ; Palmisano, Giuseppe
Author_Institution :
DIEES, Univ. di Catania, Italy
Volume :
51
Issue :
6
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
1203
Lastpage :
1209
Abstract :
A lumped scalable model for spiral inductors in silicon bipolar technology has been developed. The effect of three different cross sections on inductor performance was first investigated by comparing experimental measurements. Using both the results of this analysis and three-dimensional electromagnetic simulation guidelines, several circular inductors were integrated on a radial patterned ground shield for model validation purposes. The model employs a novel equation for series resistance with only one fitting parameter extracted from experimental measurements. All other model elements were related to technological and geometrical data by using rigorous analytical equations. The model was validated using one- and two-port measured performance parameters of 45 integrated inductors, and excellent agreement was found for all considered geometries up to frequencies well above self-resonance.
Keywords :
bipolar integrated circuits; inductors; integrated circuit layout; integrated circuit modelling; lumped parameter networks; silicon; electromagnetic simulation; lumped scalable model; radial-patterned ground shield; silicon bipolar technology; silicon integrated spiral inductors; Electrical resistance measurement; Electromagnetic analysis; Electromagnetic induction; Electromagnetic measurements; Equations; Inductors; Pattern analysis; Silicon; Solid modeling; Spirals; Bipolar technology; integrated inductors; lumped model; patterned ground shield;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2004.829301
Filename :
1304976
Link To Document :
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