Title :
Dielectric properties of Ba0.6Sr0.4TiO3-Sr(Ga0.5Ta0.5)O3 solid solutions
Author :
Xu, Yebin ; Liu, Ting ; He, Yanyan ; Yuan, Xiao
Author_Institution :
Inst. of Optoelectron. Sci. & Eng., Huazhong Univ. of Sci. & Technol., Wuhan
fDate :
11/1/2008 12:00:00 AM
Abstract :
Ba0.6Sr0.4TiO3-Sr(Ga0.5Ta0.5)O3 solid solutions are prepared by a solid-state reaction method, and their dielectric and tunable characteristics are investigated. The solid solutions with cubic perovskite structures are obtained for compositions of 10-50 mol% Sr(Ga0.5Ta0.5)O3. It is observed that the addition of Sr(Ga0.5Ta0.5)O3 into Ba0.6Sr0.4TiO3 causes a shift in the phase transition peak to a lower temperature. Ba0.6Sr0.4TiO3-Sr(Ga0.5Ta0.5)O3 solid solutions exhibit depressed and broadened phase transition peaks, resulting in decreased dielectric constants and dielectric losses at room temperature. With the increase of Sr(Ga0.5Ta0.5)O3 content, the dielectric constant, loss tangent, and tunability are decreased. 0.9Ba0.6Sr0.4TiO3-0.1Sr(Ga0.5Ta0.5)O3 has a dielectric constant epsiv = 534 and a tunability of 16% at 100 kHz under 2.63 kV/mm. The dielectric characteristics of Ba0.6Sr0.4TiO3- Sr(Ga0.5Ta0.5)O3 ceramics at microwave frequencies are also evaluated.
Keywords :
barium compounds; dielectric losses; ferroelectric ceramics; ferroelectric transitions; gallium compounds; permittivity; strontium compounds; tantalum compounds; Ba0.6Sr0.4TiO3-Sr(Ga0.5Ta0.5)O3; ceramics; cubic perovskite structures; dielectric constants; dielectric losses; dielectric properties; loss tangent; microwave frequencies; phase transition peak; solid solutions; solid-state reaction method; temperature 293 K to 298 K; Ceramics; Density measurement; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Microwave technology; Powders; Temperature; X-ray diffraction; Barium Compounds; Electric Conductivity; Materials Testing; Microwaves; Oxides; Solutions; Strontium; Titanium;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
