DocumentCode :
1007352
Title :
Lateral epitaxial overgrowth of silicon over recessed oxide
Author :
Jayadev, T.S. ; Okazaki, E. ; Petersen, Hauke ; Millman, M.
Author_Institution :
Lockheed Missiles & Space Co., Lockheed Palo Alto Research Laboratory, Palo Alto, USA
Volume :
21
Issue :
8
fYear :
1985
Firstpage :
327
Lastpage :
328
Abstract :
There has been considerable interest in silicon-on-insulator (SOI) technology recently because of its potential applications in VLSI. CMOS circuits in SOI have higher speed because of the absence of substrate capacitance, and freedom from latch-up because of dielectric isolation. Recently, memory circuits like DRAMs have reached the physical limits of what is possible in two dimensions, and hence there is a growing need for 3-dimensional circuits. SOI offers a possible avenue to realise such 3-D circuits and thus lead the way to the next generation of memories and integrated circuits.
Keywords :
VLSI; elemental semiconductors; integrated circuit technology; semiconductor epitaxial layers; semiconductor growth; silicon; 3-dimensional circuits; CMOS; SOI; Si; VLSI; lateral epitaxial overgrowth; memory circuits; silicon-on-insulator;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19850231
Filename :
4251054
Link To Document :
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