• DocumentCode
    1007352
  • Title

    Lateral epitaxial overgrowth of silicon over recessed oxide

  • Author

    Jayadev, T.S. ; Okazaki, E. ; Petersen, Hauke ; Millman, M.

  • Author_Institution
    Lockheed Missiles & Space Co., Lockheed Palo Alto Research Laboratory, Palo Alto, USA
  • Volume
    21
  • Issue
    8
  • fYear
    1985
  • Firstpage
    327
  • Lastpage
    328
  • Abstract
    There has been considerable interest in silicon-on-insulator (SOI) technology recently because of its potential applications in VLSI. CMOS circuits in SOI have higher speed because of the absence of substrate capacitance, and freedom from latch-up because of dielectric isolation. Recently, memory circuits like DRAMs have reached the physical limits of what is possible in two dimensions, and hence there is a growing need for 3-dimensional circuits. SOI offers a possible avenue to realise such 3-D circuits and thus lead the way to the next generation of memories and integrated circuits.
  • Keywords
    VLSI; elemental semiconductors; integrated circuit technology; semiconductor epitaxial layers; semiconductor growth; silicon; 3-dimensional circuits; CMOS; SOI; Si; VLSI; lateral epitaxial overgrowth; memory circuits; silicon-on-insulator;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19850231
  • Filename
    4251054