Title :
On the testability of one-dimensional ILAs for multiple sequential faults
Author :
Vergis, Anastasios
Author_Institution :
Dept. of Comput. Sci., Patras Univ., Greece
fDate :
7/1/1992 12:00:00 AM
Abstract :
It is shown that one-dimensional, unilateral iterative logic arrays (ILAs) of combinational cells are C-testable for multiple sequential faults, provided the fault-free cell functions satisfy appropriate conditions. The test sequence is of length O((m 2n2+mn3)× K), where n (resp. m) is the number of signal values that can be applied to the horizontal (resp. vertical) cell input and K⩽n-1. Linear testability is also considered. The ripple-carry adder circuit (n=2, m=4) is shown to be C-testable with 699 test vectors
Keywords :
adders; logic arrays; logic testing; C-testable; combinational cells; fault-free cell functions; linear testability; multiple sequential faults; one-dimensional ILAs; ripple-carry adder circuit; testability; Adders; Array signal processing; Circuit faults; Circuit testing; Fabrication; Logic arrays; Logic devices; Logic testing; Sequential analysis; Vectors;
Journal_Title :
Computers, IEEE Transactions on
