• DocumentCode
    1007415
  • Title

    On the testability of one-dimensional ILAs for multiple sequential faults

  • Author

    Vergis, Anastasios

  • Author_Institution
    Dept. of Comput. Sci., Patras Univ., Greece
  • Volume
    41
  • Issue
    7
  • fYear
    1992
  • fDate
    7/1/1992 12:00:00 AM
  • Firstpage
    906
  • Lastpage
    916
  • Abstract
    It is shown that one-dimensional, unilateral iterative logic arrays (ILAs) of combinational cells are C-testable for multiple sequential faults, provided the fault-free cell functions satisfy appropriate conditions. The test sequence is of length O((m 2n2+mn3)× K), where n (resp. m) is the number of signal values that can be applied to the horizontal (resp. vertical) cell input and K⩽n-1. Linear testability is also considered. The ripple-carry adder circuit (n=2, m=4) is shown to be C-testable with 699 test vectors
  • Keywords
    adders; logic arrays; logic testing; C-testable; combinational cells; fault-free cell functions; linear testability; multiple sequential faults; one-dimensional ILAs; ripple-carry adder circuit; testability; Adders; Array signal processing; Circuit faults; Circuit testing; Fabrication; Logic arrays; Logic devices; Logic testing; Sequential analysis; Vectors;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.256448
  • Filename
    256448
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1007415