DocumentCode :
1007555
Title :
Measurement of intrinsic dynamics of SOA using outband optical modulation
Author :
Hu, M.H. ; Caneau, C. ; Liu, X. ; Nishiyama, N. ; Nguyen, H.K. ; Leblanc, H. ; Visovsky, N. ; Zah, C.E.
Author_Institution :
Corning Inc., NY, USA
Volume :
40
Issue :
12
fYear :
2004
fDate :
6/10/2004 12:00:00 AM
Firstpage :
758
Lastpage :
759
Abstract :
A parasitic-free technique using outband optical modulation for measuring a semiconductor optical amplifier´s (SOA´s) dynamic response is proposed. It is demonstrated that a counter-propagating scheme is useful in measuring the carrier lifetimes and the response obtained with a co-propagating scheme includes the transmission function of an SOA.
Keywords :
III-V semiconductors; carrier lifetime; dynamic response; indium compounds; optical modulation; semiconductor optical amplifiers; semiconductor quantum wells; InP; SOA; carrier lifetime; counter-propagating scheme; dynamic response; intrinsic dynamic measurement; outband optical modulation; parasitic-free technique; semiconductor optical amplifier; transmission function;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20040465
Filename :
1305487
Link To Document :
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