• DocumentCode
    1007630
  • Title

    High-power vertical-cavity surface-emitting laser with an extra Au layer

  • Author

    Changling Yan ; Yongqiang Ning ; Li Qin ; Dafu Cui ; Yun Liu ; Yanfang Sun ; Zhenhua Jin ; Huiqing Li ; Getao Tao ; Chao Wang ; Lijun Wang ; Huilin Jiang

  • Author_Institution
    Lab. of Excited State Processes, Chinese Acad. of Sci., Changchun, China
  • Volume
    17
  • Issue
    8
  • fYear
    2005
  • Firstpage
    1599
  • Lastpage
    1601
  • Abstract
    We report the performance of a high-power vertical-cavity surface-emitting laser (VCSEL) with an extra Au layer. By using the extra Au layer, the far-field divergence angle from a 600-μm diameter VCSEL device is suppressed from 30/spl deg/ to 15/spl deg/, and no strong sidelobe is observed in far-field pattern. There is a slight drop in optical output power due to the introduction of the extra Au layer. By improving the device packaging method, the VCSEL device produces the maximum continuous-wave optical output power of 1.95 W with lasing wavelength of 981.5 nm. The aging test is carried out under constant current mode at 60/spl deg/C, and the preliminary result shows that the total degradation of output power is less than 10% after 800 h.
  • Keywords
    ageing; gold; laser cavity resonators; packaging; quantum well lasers; surface emitting lasers; 1.95 W; 60 degC; 600 mum; 800 h; 981.5 nm; Au; aging test; constant current mode; continuous-wave optical output power; device packaging method; extra Au layer; far-field divergence angle; far-field pattern; high-power laser; optical output power; output power degradation; quantum-well active region; vertical-cavity surface-emitting laser; Aging; Degradation; Gold; Optical devices; Optical surface waves; Packaging; Power generation; Surface emitting lasers; Testing; Vertical cavity surface emitting lasers; Aging test; far-field pattern; vertical-cavity surface-emitting lasers (VCSELs);
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2005.850903
  • Filename
    1471747