Title :
Testability enhancement of domino CMOS logic
Author :
Pretorius, J.A. ; Shubat, A.S. ; Salama, C.A.T.
Author_Institution :
University of Toronto, Department of Electrical Engineering, Toronto, Canada
Abstract :
A simple circuit technique to enhance the testability of domino CMOS circuits is presented. The fact that domino CMOS gates always have their outputs precharged low enables one to test for output stuck-at-one faults by a simple modification of the domino gate.
Keywords :
CMOS integrated circuits; integrated logic circuits; logic design; logic testing; domino CMOS logic; domino gate modification; logic design; output stick-at-one faults; testability;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19850237
