DocumentCode
1007767
Title
Tunnelling through very low barriers
Author
Gu¿¿ret, P. ; Kaufmann, U. ; Marclay, E.
Author_Institution
IBM Zurich Research Laboratory, Rÿschlikon, Switzerland
Volume
21
Issue
8
fYear
1985
Firstpage
344
Lastpage
346
Abstract
Tunnelling through very low barriers made with GaAs/Ga1¿xAlxAs/GaAs heterostructures is investigated. The lowest barrier has a height of 40 meV and a thickness of about 450 Ã
. Reasonable agreement between design parameters, measured data and theoretical values is obtained.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; p-n heterojunctions; tunnelling; GaAs/Ga1-xAlxAs/GaAs heterostructures; III-V semiconductors; electron transport; tunnelling; very low barriers;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19850243
Filename
4251098
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