DocumentCode :
1008439
Title :
Interface measurements and methods employed
Author :
Jones, W.R.
Author_Institution :
Cornell University
Issue :
1
fYear :
1954
Firstpage :
58
Lastpage :
58
fLanguage :
English
Journal_Title :
Electron Devices, Transactions of the IRE Professional Group on
Publisher :
ieee
ISSN :
0197-6370
Type :
jour
DOI :
10.1109/T-ED.1954.13963
Filename :
1471823
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1008439
