DocumentCode :
1008563
Title :
Shorts due to diagnostic leads
Author :
Ellis, J.F. ; Lubell, M.S. ; Walstrom, S. ; Walstrom, P. ; Thome, R.J. ; Pillsbury, R.D.
Author_Institution :
Oak Ridge National Laboratory, Oak Ridge, Tennessee
Volume :
21
Issue :
2
fYear :
1985
fDate :
3/1/1985 12:00:00 AM
Firstpage :
1060
Lastpage :
1063
Abstract :
The superconducting toroidal field coils that are being tested in the Large Coil Test Facility (LCTF) are heavily instrumented. In the General Electric coil, a lead wire of an internal sensor became shorted across an estimated three or four turns of the pancake winding. This short occurred during the final stages of the winding fabrication and was not accessible for repair. Resistance, voltage gradient, and transient voltage decay measurements were performed to characterize the short and the magnetic damping of the large steel bobbin and outer structural ring. The 32-gage wire causing the short was estimated to be about 10 cm long, with a resistance of 55 mΩ. As a safety measure, we decided to Burn out the shorted wire at room temperature before installing the coil in LCTF. Tests were made to determine the energy needed to vaporize a small wire. Computer calculations indicated that within the voltage limits set for the coil, it was not feasible to burn out the wire by rapidly dumping the coil from a low-current dc charge-up. We accomplished the burnout by applying 800 V at 3.25 A, and 60 Hz for about 1 s. Transient voltage decay measurements made after the burnout and compared with those made before the attempt confirmed that the short had indeed been opened.
Keywords :
Superconducting coils; Electrical resistance measurement; Fabrication; Instruments; Magnetic sensors; Sensor phenomena and characterization; Superconducting coils; Superconducting filaments and wires; Test facilities; Testing; Voltage measurement;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1985.1063678
Filename :
1063678
Link To Document :
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