DocumentCode :
1009071
Title :
Noise measurements of microwave local oscillators
Author :
Mueller, R.
Author_Institution :
Siemens and Halske A. G. Company
Issue :
4
fYear :
1954
Firstpage :
42
Lastpage :
50
Abstract :
A method for measuring the spectral distribution of amplitude fluctuations and frequency fluctuations in microwave oscillators is described. The method provides for evaluation of (1) amplitude fluctuations in terms of signal to noise ratio; (2) frequency fluctuations in terms of two parameters: (a) rms deviation; (b) rms rate of change of deviation. In addition, the method permits estimation of the correlation between these two noise components. Some typical results of measurements are described, and certain implications of the effects of system parameters on interpretation of these results are considered. For a specific system, two measurements are shown to be sufficient to determine the effect of frequency noise on system performance.
fLanguage :
English
Journal_Title :
Electron Devices, Transactions of the IRE Professional Group on
Publisher :
ieee
ISSN :
0197-6370
Type :
jour
DOI :
10.1109/T-ED.1954.14028
Filename :
1471888
Link To Document :
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