Title :
A technique for measuring FM noise in microwave oscillators
Author :
McClain, E.F. ; Ferris, W.R.
Author_Institution :
Naval Research Laboratory, Washington, D. C.
Abstract :
Previous methods of analyzing the low-frequency noise spectrum of microwave oscillators have employed the usual scanning-type spectrum analyzer or an arrangement of fixed-tuned filters. The visual presentation of the spectrum analyzer makes high accuracy difficult, while a series of filters does not provide the necessary frequency discrimination. The present system makes use of a chart recorder to present noise level versus frequency as a continuous plot from 0 to 16,000 cycles.
Journal_Title :
Electron Devices, Transactions of the IRE Professional Group on
DOI :
10.1109/T-ED.1954.14034