DocumentCode
1009335
Title
Testing ADC´s at sample rates from 20 to 120 MSPS
Author
Crawley, H.B. ; McKay, Richard ; Meyer, W.T. ; Rosenberg, E.I. ; Thomas, W.D.
Author_Institution
Dept.of Phys., Iowa State Univ., Ames, IA, USA
Volume
40
Issue
4
fYear
1993
fDate
8/1/1993 12:00:00 AM
Firstpage
729
Lastpage
732
Abstract
Results are presented from an ongoing program to test the performance of high-speed analog-to-digital converters suitable for use at the Superconducting Super Collider (SSC) and Large Hadron Collider (LHC). For each device a large number of parameters is measured, such as number of effective bits, noise level, aperture jitter, nonlinearity, analog bandwidth, and total harmonic distortion. Results from a variety of 8-b and 10-b devices are presented
Keywords
analogue-digital conversion; nuclear electronics; semiconductor device noise; ADC; LHC; Large Hadron Collider; SSC; Superconducting Super Collider; analog bandwidth; analog-to-digital converters; aperture jitter; high-speed; noise level; nonlinearity; number of effective bits; total harmonic distortion; Analog-digital conversion; Apertures; Bandwidth; Distortion measurement; Jitter; Large Hadron Collider; Noise level; Noise measurement; Superconducting device noise; Testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.256650
Filename
256650
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