Title :
Testing ADC´s at sample rates from 20 to 120 MSPS
Author :
Crawley, H.B. ; McKay, Richard ; Meyer, W.T. ; Rosenberg, E.I. ; Thomas, W.D.
Author_Institution :
Dept.of Phys., Iowa State Univ., Ames, IA, USA
fDate :
8/1/1993 12:00:00 AM
Abstract :
Results are presented from an ongoing program to test the performance of high-speed analog-to-digital converters suitable for use at the Superconducting Super Collider (SSC) and Large Hadron Collider (LHC). For each device a large number of parameters is measured, such as number of effective bits, noise level, aperture jitter, nonlinearity, analog bandwidth, and total harmonic distortion. Results from a variety of 8-b and 10-b devices are presented
Keywords :
analogue-digital conversion; nuclear electronics; semiconductor device noise; ADC; LHC; Large Hadron Collider; SSC; Superconducting Super Collider; analog bandwidth; analog-to-digital converters; aperture jitter; high-speed; noise level; nonlinearity; number of effective bits; total harmonic distortion; Analog-digital conversion; Apertures; Bandwidth; Distortion measurement; Jitter; Large Hadron Collider; Noise level; Noise measurement; Superconducting device noise; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
