• DocumentCode
    1009373
  • Title

    Development of augmented reality system for AFM-based nanomanipulation

  • Author

    Li, Guangyong ; Xi, Ning ; Yu, Mengmeng ; Fung, Wai-Keung

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
  • Volume
    9
  • Issue
    2
  • fYear
    2004
  • fDate
    6/1/2004 12:00:00 AM
  • Firstpage
    358
  • Lastpage
    365
  • Abstract
    Using atomic force microscopy (AFM) as a nanomanipulation tool has been discussed for more than a decade. However, its lack of real-time visual feedback during manipulation has hindered its wide application. Fortunately, this problem has been overcome by our recently developed augmented reality system. By locally updating the AFM image based on real-time force information during manipulation, not only can this new system provide real-time force feedback but also real-time visual feedback. The real-time visual display combined with the real-time force feedback provides an augmented reality environment, in which the operator not only can feel the interaction forces but also observe the real-time changes of the nano-environment. This augmented reality system capable of nanolithography and manipulation of nano-particles helps the operator to perform several operations without the need of a new image scan, which makes AFM-based nano-assembly feasible and applicable.
  • Keywords
    atomic force microscopy; augmented reality; force feedback; microassembling; micromanipulators; nanolithography; AFM-based nanoassembly; AFM-based nanomanipulation; atomic force microscopy; augmented reality system; augmented reality systems; image scan; nanoenvironment; nanolithography; nanoparticle manipulation; real-time visual display; real-time visual force feedback; Atomic force microscopy; Augmented reality; Charge-coupled image sensors; Displays; Force feedback; Haptic interfaces; Nanolithography; Nanoscale devices; Real time systems; Virtual reality;
  • fLanguage
    English
  • Journal_Title
    Mechatronics, IEEE/ASME Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4435
  • Type

    jour

  • DOI
    10.1109/TMECH.2004.828651
  • Filename
    1306449