• DocumentCode
    1009404
  • Title

    Fabrication and performance of all refractory josephson logic circuits for 1 Kbit SFQ memory

  • Author

    Tahara, S. ; Kosaka, S. ; Shoji, A. ; Aoyagi, M. ; Shinoki, F. ; Hayakawa, H.

  • Author_Institution
    Electrochemical Laboratory, Umezono, Sakura-mura, Niihari-gun, Ibaraki, Japan
  • Volume
    21
  • Issue
    2
  • fYear
    1985
  • fDate
    3/1/1985 12:00:00 AM
  • Firstpage
    733
  • Lastpage
    736
  • Abstract
    All refractory Josephson loop logic circuits for a 1Kbit SFQ memory have been developed. The circuit fabircation technology, using NbN/Nb double layered junction formation and reactive ion etching(RIE)with a 2.5μm minimum feature size and 1.5μm overlay registration, has been utilized. A highly selective and anisotropic RIE process has been performed, in which a CCl2F2+ Ne gas mixture has been used as etching gases. The experimental circuit consists of address decoders and line drivers, which are based on the principle of current steering in superconducting loops. The decoder and driver were successfully operated with the gate current margin of ±18% and ±14%, respectively. The decoder internal delay time was measured to be about 1.5 ns. It is revealed that these circuits have a satisfactory preformance to be used in the 1Kbit SFQ memory.
  • Keywords
    Josephson device logic; Josephson device memories; Anisotropic magnetoresistance; Decoding; Delay effects; Driver circuits; Etching; Fabrication; Gases; Josephson junctions; Logic circuits; Niobium;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1985.1063744
  • Filename
    1063744