• DocumentCode
    1009431
  • Title

    Development of a high-resolution quartz resonator force and weight sensor with increased reliability

  • Author

    Wang, Zheyao ; Zhu, Huizhong ; Dong, Yonggui ; Feng, Guanping

  • Author_Institution
    Inst. of Microelectron., Tsinghua Univ., Beijing, China
  • Volume
    9
  • Issue
    2
  • fYear
    2004
  • fDate
    6/1/2004 12:00:00 AM
  • Firstpage
    399
  • Lastpage
    406
  • Abstract
    Test-analyze-and-redesign method is employed to develop a quartz crystal resonator (QCR) force and weight sensor with increased reliability for batch production. The sensor, which mainly consists of a QCR and a metal diaphragm structure, has the advantages of high resolution, digital output, and low cost. The failure mechanism of the single-diaphragm QCR sensor has been uncovered by experiments aiming at providing insight into the failure factors. In order to eliminate the failure stress and improve reliability, the sensor has been redesigned based on failure analysis results by designing a double-diaphragm structure. Life testing experiments for validating the effect of the corrective action show that reliability has been improved five times, and after redesign, the reliability satisfies the requirement of practical use. Accelerated life testing is performed to find acceleration factors and development stresses for batch production.
  • Keywords
    batch production systems; crystal resonators; design for manufacture; failure analysis; force sensors; life testing; nonelectric sensing devices; reliability; accelerated life testing; batch production reliability; failure analysis; failure stress elimination; high-resolution quartz resonator force; metal diaphragm structure; quartz crystal resonator; test-analyze-and-redesign method; weight sensor; Costs; Failure analysis; Force measurement; Force sensors; Intelligent sensors; Mechanical sensors; Mechatronics; Optical resonators; Production; Stress;
  • fLanguage
    English
  • Journal_Title
    Mechatronics, IEEE/ASME Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4435
  • Type

    jour

  • DOI
    10.1109/TMECH.2004.828643
  • Filename
    1306454