DocumentCode
1009431
Title
Development of a high-resolution quartz resonator force and weight sensor with increased reliability
Author
Wang, Zheyao ; Zhu, Huizhong ; Dong, Yonggui ; Feng, Guanping
Author_Institution
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Volume
9
Issue
2
fYear
2004
fDate
6/1/2004 12:00:00 AM
Firstpage
399
Lastpage
406
Abstract
Test-analyze-and-redesign method is employed to develop a quartz crystal resonator (QCR) force and weight sensor with increased reliability for batch production. The sensor, which mainly consists of a QCR and a metal diaphragm structure, has the advantages of high resolution, digital output, and low cost. The failure mechanism of the single-diaphragm QCR sensor has been uncovered by experiments aiming at providing insight into the failure factors. In order to eliminate the failure stress and improve reliability, the sensor has been redesigned based on failure analysis results by designing a double-diaphragm structure. Life testing experiments for validating the effect of the corrective action show that reliability has been improved five times, and after redesign, the reliability satisfies the requirement of practical use. Accelerated life testing is performed to find acceleration factors and development stresses for batch production.
Keywords
batch production systems; crystal resonators; design for manufacture; failure analysis; force sensors; life testing; nonelectric sensing devices; reliability; accelerated life testing; batch production reliability; failure analysis; failure stress elimination; high-resolution quartz resonator force; metal diaphragm structure; quartz crystal resonator; test-analyze-and-redesign method; weight sensor; Costs; Failure analysis; Force measurement; Force sensors; Intelligent sensors; Mechanical sensors; Mechatronics; Optical resonators; Production; Stress;
fLanguage
English
Journal_Title
Mechatronics, IEEE/ASME Transactions on
Publisher
ieee
ISSN
1083-4435
Type
jour
DOI
10.1109/TMECH.2004.828643
Filename
1306454
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