Title :
Evaluation of HgI2 detectors for lead detection in paint
Author :
Wang, Y.J. ; Iwanczyk, J.S. ; Graham, W.R.
Author_Institution :
Xsirius Inc., Marina del Rey, CA, USA
fDate :
8/1/1993 12:00:00 AM
Abstract :
A laboratory study of HgI2 spectrometers used for in situ determination of lead on painted surfaces was conducted. 109 Cd and 57Co isotopes were used to excite lead characteristic X-rays from samples. The energy resolution of HgI2 detectors in the energy region corresponding to lead K X-rays was measured. An energy resolution of 880 eV full-width half-maximum (FWHM) for the 60-keV line from a 241Am source was obtained. Measurements using thin film standards ranging from 0.5 mg Pb/cm2 to 2 mg Pb/cm2 were conducted. The detection limits the accuracy and the precision of the measurements were estimated. Based upon a comparison of the results obtained with the performance of existing detector technology, HgI2 detectors seem to be the best solution for hand-held X-ray fluorescence (XRF) lead analyzers
Keywords :
X-ray apparatus; X-ray detection and measurement; X-ray fluorescence analysis; lead; semiconductor counters; 60 keV; 880 eV; HgI2 detectors; HgI2 spectrometers; Pb detection; X-ray fluorescence; X-rays; detection limits; energy resolution; full-width half-maximum; paint; Energy measurement; Energy resolution; Isotopes; Laboratories; Lead; Measurement standards; Spectroscopy; Transistors; X-ray detection; X-ray detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on
