Using an in-situ, self-aligned deposition scheme, arrays of variable length SNS junctions in the range of 0.05μm to 1 μm have been fabricated. Arrays of SNS microbridges of lead-copper and niobium-copper fabricated using this technique have been used to study the length dependence, at constant temperature, of the critical current I
cand bridge resistance R
d. For bridges with lengths L greater than the normal metal coherence length

(T), the dependence of I
con L is consistent with an exponential dependence on the reduced length

(T). For shorter bridges, deviations from this behavior is seen. It was also found that the bridge resistance R
ddoes not vary linearly with the geometric bridge length but appears to approach a finite value as

.