Title :
Microwave technique for reflector antenna profile measurement
Author :
Bennett, Janine C. ; Swan, D.G.
Author_Institution :
University of Sheffield, Department of Electronics & Electrical Engineering, Sheffield, UK
Abstract :
A method for microwave measurement of the reflector antenna surface profile is described. The technique uses a focused monostatic secondary reflector located on axis at approximately two focal lenths from the reflector under test. Measurement of the two-ways phase change provides profile error information over a set of annular sections. Practical results are provided to illustrate the spatial resolution and sensitivity of the technique.
Keywords :
microwave antennas; microwave measurement; reflector antennas; surface topography measurement; annular sections; focused monostatic secondary reflector; microwave measurement; profile error information; profile measurement; reflector antenna; sensitivity; spatial resolution; two-way phase change;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19850396
