DocumentCode :
1009919
Title :
Characterization of Nb-8 wt.% Al wires by analytical electron microscopy
Author :
King, Wayne E. ; Thieme, C.L.H. ; Foner, S.
Author_Institution :
Argonne National Laboratory, Argonne, IL
Volume :
21
Issue :
2
fYear :
1985
fDate :
3/1/1985 12:00:00 AM
Firstpage :
815
Lastpage :
818
Abstract :
Analytical electron microscopic observations of longitudinal cross-sections of Nb-8 wt.% Al powder metallurgy processed wire are presented. Grains were found of unreacted Nb, Nb-Al which was identified as Al5 Nb-Al by convergent beam electron diffraction (CBED), and Nb-Al grains identified as Nb2Al by CBED. No unreacted Al is found. High resolution TEM views for each phase and for regions at the phase boundaries are also presented. Comparisons of the composition of arc melted Nb3Al are made with the low temperature P/M processed Al5 phase.
Keywords :
Electron microscopy; Superconducting cables; Wiring; Electron beams; Electron microscopy; Laboratories; Magnetic analysis; Magnetic force microscopy; Materials science and technology; Plasma temperature; Powders; Transmission electron microscopy; Wires;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1985.1063789
Filename :
1063789
Link To Document :
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