• DocumentCode
    1009940
  • Title

    Two-dimensional E-field mapping with subpicosecond temporal resolution

  • Author

    Meyer, K.E. ; Mourou, G.A.

  • Author_Institution
    University of Rochester, Laboratory for Laser Energetics, Rochester, USA
  • Volume
    21
  • Issue
    13
  • fYear
    1985
  • Firstpage
    568
  • Lastpage
    569
  • Abstract
    A new contactless reflection-mode electro-optic sampling technique is described which is capable of characterising the electrical response of microstructures in two dimensions with micrometre spatial resolution, a temporal response of a fraction of a picosecond and millivolt sensitivity. A GaAs-based sampling technique which would have minimum interference with the test circuit is also proposed.
  • Keywords
    VLSI; electric field measurement; field plotting; integrated circuit testing; large scale integration; GaAs-based sampling technique; LSI; VLSI testing; birefringence; contactless method; electric field distribution; electrical response; electro-optic sampling technique; micrometre spatial resolution; microstructure characterisation; millivolt sensitivity; reflection-mode; subpicosecond temporal resolution; two-dimensional E-field mapping; very-high-speed semiconductor devices;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19850401
  • Filename
    4251332
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1009940