• DocumentCode
    1010038
  • Title

    Introduction to the Special Issue on Negative Bias Temperature Instability

  • Author

    Rosa, G. La ; Krishnan, A.

  • Volume
    7
  • Issue
    4
  • fYear
    2007
  • Firstpage
    500
  • Lastpage
    501
  • Abstract
    The nine invited papers in this special issue are intended to reflect the current thinking among different researchers on the controversial aspects of the negative bias temperature instability (NBTI) mechanism.
  • Keywords
    CMOS technology; Circuit simulation; MOSFET circuits; Materials reliability; Negative bias temperature instability; Niobium compounds; Physics; Special issues and sections; Stress; Titanium compounds;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2007.914389
  • Filename
    4403238
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1010038