DocumentCode :
1010309
Title :
Temperature dependence of submillimeter wave response in the point-contact Josephson junction
Author :
Morita, Seizo ; Imai, Syozo ; Senoh, Tomonobu ; Mikoshiba, Nobuo
Author_Institution :
Tohoku University, Sendai, Japan
Volume :
21
Issue :
2
fYear :
1985
fDate :
3/1/1985 12:00:00 AM
Firstpage :
644
Lastpage :
647
Abstract :
We have measured the magnitude of the first Shapiro step in both bridge-type (Ta-Ta and Ta-Sn) and tunnel-type (Ta-SnOx-Sn) point-contact Josephson junctions in the SMMW ( Submillimeter Wave ) region. By varying the temperature continuously with the frequency of the SMMW fixed (ω=2π/λ, λ = 699, 570 and 469μm) . we determined I_{1}^{\\max }/I_{c} minutely as a function of the normalized frequency \\omega /\\omega _{g} (T), where I_{1}^{\\max } is the maximum (half) height of the first Shapiro step as a function of the ac field power, Icis the critical current, and \\omega _{g}(T)=4\\Delta _{Ta}(T)/h or 2(\\Delta _{Ta}(T)+\\Delta _{Sn}(T))/h . By fitting the shape of the Riedel peak at \\omega /\\omega _{g}(T)=I with the theory of the tunnel junction, we have determined the damping factor δ. We obtained δ =0.02 for the Ta-SnOx-Sn tunnel- type junction, and δ=0.05 for both the Ta-Sn and Ta-Ta bridge - type junctions, respectively. At \\omega /\\omega _{g}(T)> 1.5 , we have found that I_{1}^{\\max }/I_{c} tends to saturate in both the tunnel-type and the bridge-type junctions as \\omega /\\omega _{g}(T) increases. For the tunnel-type junction, this agrees with the very slow decrease predicted by the theory of the tunnel junction. But for the bridge-type junction, this slow decrease is in marked contrast to the very rapid decrease found from the previous experiments, where the Shapiro step was measuared for a number of frequencies at a fixed temperature.
Keywords :
Josephson devices; Submillimeter wave devices; Damping; Electrodes; Frequency dependence; Josephson effect; Josephson junctions; Laser theory; Microscopy; Submillimeter wave communication; Superconductivity; Temperature dependence;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1985.1063824
Filename :
1063824
Link To Document :
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