Title :
Strained-quantum-well, modulation-doped, field-effect transistor
Author :
Zipperian, T.E. ; Drummond, T.J.
Author_Institution :
Sandia National Laboratories, Albuquerque, USA
Abstract :
A new modulation-doped field-effect transistor structure which employs a thin (8 nm) strained layer of In 0.25 Ga 0.75 As as the channel is described. The prototype device with a 2.9 ¿m gate length had a peak, room-temperature, unilluminated extrinsic transconductance of 91 mS/mm (VDS = 1 V). If device performance scaled linearly with gate length to 1 ¿m, as do (Al, Ga)As/GaAs, single-interface, modulation-doped FETs, this is the best room-temperature performance reported to date for an (In, Ga)As channel, modulation-doped transistor. Furthermore, the transconductance of the strained-quantum-well transistor proved to be almost constant with gate voltage, varying less than 13% over a 0.5 V range at 77 K. This will allow the fabrication of extremely linear microwave amplifiers and supports the assertion that the current conduction path is the (In, Ga)As channel.
Keywords :
high electron mobility transistors; (In, Ga)As channel; In0.25Ga0.75As; MODFET; current conduction path; extrinsic transconductance 91 m5/mm; gate length 2.9 microns; linear microwave amplifiers; modulation-doped field-effect transistor structure; room-temperature performance; strained-quantum-well transistor; transconductance;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19850580